Defect sensibility of N2-SF6 gas mixtures with equal dielectric strength

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 1, Issue , 2000, Pages 422-425

  Graf, R ^a   Boeck, W ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY MIXTURES; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES OF GASES; ELECTRIC BREAKDOWN; IMPULSE TESTING; NITROGEN; SULFUR COMPOUNDS;

DIELECTRIC STRENGTH; SWITCHING IMPULSE VOLTAGES;

ELECTRIC INSULATING MATERIALS;

EID: 0034510107     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)