메뉴 건너뛰기




Volumn 138, Issue 1-2, 2000, Pages 1-17

Electrical degradation of LSM-YSZ interfaces

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CURING; DEGRADATION; ELECTRIC IMPEDANCE; HIGH TEMPERATURE OPERATIONS; INTERFACES (MATERIALS); LANTHANUM COMPOUNDS; YTTRIUM COMPOUNDS; ZIRCONIA;

EID: 0034509261     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0167-2738(00)00769-4     Document Type: Article
Times cited : (35)

References (76)
  • 47
    • 85031556765 scopus 로고    scopus 로고
    • Thesis, Saint Etienne, France
    • M.C. Steil, Thesis, Saint Etienne, France, 1996.
    • (1996)
    • Steil, M.C.1
  • 48
    • 85031536828 scopus 로고
    • Thesis, Grenoble, France
    • L. Dessemond, Thesis, Grenoble, France, 1992.
    • (1992)
    • Dessemond, L.1
  • 60
  • 61
    • 85031542638 scopus 로고
    • Thesis, Grenoble, France
    • M. Kleitz, Thesis, Grenoble, France, 1968.
    • (1968)
    • Kleitz, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.