Expected warranty cost of two-attribute free-replacement warranties based on a bivariate exponential distribution

Computers and Industrial Engineering

Volumn 38, Issue 4, 2000, Pages 425-434

  Kim, H G ^a   Rao, B M ^b  

^a Dong Eui University   (South Korea)

^b BOWLING GREEN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; COSTS; FAILURE ANALYSIS; PROBABILITY DISTRIBUTIONS; PURCHASING;

BIVARIATE EXPONENTIAL DISTRIBUTIONS; WARRANTY COSTS;

COMPUTER INTEGRATED MANUFACTURING;

EID: 0034508939     PISSN: 03608352     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0360-8352(00)00055-3     Document Type: Article

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