Accelerated aging of high voltage encapsulated transformers for electronics applications

Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

Volumn 1, Issue , 2000, Pages 209-212

  Feilat, E A ^a   Grzybowski, S ^a   Knight, P ^a  

^a MISSISSIPPI STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AGING OF MATERIALS; DIELECTRIC LOSSES; MATHEMATICAL MODELS; MAXIMUM LIKELIHOOD ESTIMATION; PARTIAL DISCHARGES; PROBABILITY DENSITY FUNCTION; PROBABILITY DISTRIBUTIONS; STATISTICAL METHODS; WEIBULL DISTRIBUTION;

ACCELERATED AGING; ENCAPSULATED TRANSFORMERS; INVERSE POWER LAW MODEL; STATISTICAL DISTRIBUTION;

ELECTRIC TRANSFORMER INSULATION;

EID: 0034508930     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)