Powder Rietveld refinement of armstrongite, CaZr[Si6Ol5] · 3 H2O

Zeitschrift fur Kristallographie

Volumn 215, Issue 12, 2000, Pages 757-761

  Kabalov, Yu K ^a   Zubkova, N V ^a   Pushcharovsky, D Yu ^a   Schneider, J ^a   Sapozhnikov, A N ^a  

^a MOSCOW STATE UNIVERSITY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM; SILICON DIOXIDE; ZIRCONIUM;

ARTICLE; CHEMICAL STRUCTURE; COMPLEX FORMATION; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; DATA ANALYSIS; RECEPTOR OCCUPANCY; STRUCTURE ANALYSIS; X RAY DIFFRACTION;

EID: 0034508455     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (16)

1. Quantitative phase analysis using the Rietveld method
2. Empirical bond strength - Bond length curves for oxides
3. The crystal structure of elpidite
4. The crystal structure of dalyite
5. Armstrongite from the Strange Lake Alkalic Complex, on the Quebec-Labrador Boundary, Canada
6. 2O
7. Crystal structure of armstrongite
8. 15
9. Crystal chemistry of heterogeneous anionic radicals
10. Profile refinement on IBM-PCs, Int. Workshop on the Rietveld method
11. 2O: A new representative of the dalyite family in crystal chemistry
12. Armstrongite - A new silicate of calcium and zirconium
13. 11 and some characteristics of chemical composition and structure of zirconosilicates
14. A new method for quantitive X-ray analysis of multiphase mixtures
15. A novel curved position-sensitive proportional counter for X-ray diffractometry