Study and reliability analysis on testing instrument for dynamic contact resistance on contact

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 2000, Pages 109-114

  Li, Wen hua ^a   Liu, Guo jin ^a   Li, Zhi gang ^a  

^a HEBEI UNIVERSITY OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODE RAY OSCILLOSCOPES; ELECTRIC RELAYS; ELECTRIC RESISTANCE; FAILURE ANALYSIS; MATHEMATICAL MODELS; NETWORKS (CIRCUITS); RELIABILITY; STATISTICAL METHODS; USER INTERFACES;

DYNAMIC CONTACT RESISTANCE; RELIABILITY ANALYSIS; TESTING INSTRUMENT;

ELECTRIC CONTACTS;

EID: 0034506063     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)