Thickness of the post-contact lens tear film measured by interferometry

Optometry and Vision Science

Volumn 77, Issue 12 SUPPL., 2000, Pages 264-

  Nichols, Jason J ^a   King Smith, P Ewen ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FILMS; INTERFEROMETRY; LIGHT REFLECTION; OSCILLATIONS; THICKNESS MEASUREMENT;

POST CONTACT LENS TEAR FILM;

CONTACT LENSES;

EID: 0034506001     PISSN: 10405488     EISSN: None     Source Type: Journal    
DOI: 10.1097/00006324-200012001-00433     Document Type: Article

References (0)