Co-60 total dose test of 14- and 16-bit ADCs

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2000, Pages 26-31

  Tomasch, Georg ^a   Harboe Sorensen, Reno ^a   Mueller, Reinhard ^a   Tzscheetzsch, Thomas ^a  

^a MAX PLANCK INSTITUT FÜR SONNENSYSTEMFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; COBALT; INFRARED IMAGING; IRRADIATION; SIGNAL DISTORTION; SIGNAL TO NOISE RATIO; SPECTROMETERS; VOLTAGE MEASUREMENT;

ANALOG DEVICES; DEVICE UNDER TEST; LINEAR TECHNOLOGY; TOTAL DOSE TEST;

DOSIMETRY;

EID: 0034505421     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (6)