GDOES depth profiling analysis and cross-sectional transmission electron microscopy of a hard disk

Surface and Interface Analysis

Volumn 29, Issue 12, 2000, Pages 887-890

  Shimizu, K ^a   Habazaki, H ^b   Skeldon, P ^c   Thompson, G E ^c  

^a KEIO UNIVERSITY   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COATING TECHNIQUES; HARD DISK STORAGE; SPUTTER DEPOSITION; SURFACES; TRANSMISSION ELECTRON MICROSCOPY;

GLOW DISCHARGE OPTICAL EMISSION SPECTROSCOPY (GDOES);

MULTILAYERS;

EID: 0034504322     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/1096-9918(200012)29:12<887::AID-SIA942>3.0.CO;2-X     Document Type: Article

References (9)

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3. Payling R. Spectroscopy 1999; 13: 36.
4. Payling R, Jones D, Bsngtson A. Glow Discharge Optical Emission Spectroscopy. Wiley: Chichester, 1997.
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6. Shimizu K, Habazaki H, Skeldon P, Thompson GE, Wood GC. J. Surf. Finish. Soc. Jpn. 2000; 51: 518.
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8. Robertson SG, Litchie LM. J. Appl. Electrochem. 1999; 27: 789.
9. Shimizu K, Habazaki H, Skeldon P, Thompson GE, Wood GC. Surf. Interface Anal. 1999; 27: 950.