Time-lag measurement of void discharges for the clarification of the factor for partial discharge pattern

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 2, Issue , 2000, Pages 717-720

  Hozumi, Naohiro ^a   Michiue, Hajime ^a   Nagae, Hiroshi ^a   Muramoto, Yuji ^a   Nagao, Masayuki ^a  

^a TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELD MEASUREMENT; ELECTRIC POTENTIAL; ELECTRODES;

DISCHARGE PATTERNS; VOID DISCHARGES;

PARTIAL DISCHARGES;

EID: 0034504007     PISSN: 00849162     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (5)