NPL-CSIC comparison of regular reflectance measurements

Metrologia

Volumn 37, Issue 4, 2000, Pages 323-327

  Campos, J ^a   Fontecha, J L ^a   Pons, A ^a   Hanson, A ^b   Williams, D ^b   Verrill, J ^b  

^a CSIC   (Spain)

^b NATIONAL PHYSICAL LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; INFRARED RADIATION; LIGHT MEASUREMENT; SPECTROPHOTOMETRY; STANDARDS; ULTRAVIOLET RADIATION;

REFLECTANCE TRANSFER STANDARD;

LIGHT REFLECTION;

EID: 0034503730     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/37/4/10     Document Type: Article

References (3)

1. Radiometric and Photometric Characteristics of Materials and their Measurement, CIE Publication No. 38, Paris, International Commission on Illumination, 1977.
2. Born M., Wolf E., Principles of Optics, Electromagnetic Theory of Propagation, Interference and Diffraction of Light, 6th ed., Oxford, Pergamon Press, 1989.
3. Accuracy (trueness and precision) of Measurement Methods and Results, International Standard ISO 5725, Geneva, International Organization for Standardization, 1994.