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Volumn 33, Issue 3 II, 2000, Pages 915-920

Lead mercaptides: Materials useful as powder secondary standards and internal references for calibration of X-ray diffractometers at small and medium angles

(2) Tiers, G V D a Brostrom, M L a

a 3M COMPANY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALKANE DERIVATIVE; LEAD;

ARTICLE; CALIBRATION; CHEMICAL STRUCTURE; STANDARD; X RAY POWDER DIFFRACTION;

EID: 0034503644 PISSN: 00218898 EISSN: None Source Type: Journal
DOI: 10.1107/S0021889800002806 Document Type: Article

Times cited : (10)

References (22)

1
- 0006449291
- (1965) Arkiv. Kemi. , vol.24 , pp. 505-518
- Åkerström, S.¹

2
- 84971942068
- (1995) Powder Diffr. , vol.10 , pp. 91-95
- Blanton, T.N.¹ Huang, T.C.² Toraya, H.³ Hubbard, C.R.⁴ Robie, S.B.⁵ Louër, D.⁶ Göbel, H.E.⁷ Will, G.⁸ Gilles, R.⁹ Raftery, T.¹⁰

3
- 0002425886
- New York: Plenum Press
- (1995) Advances in X-ray Analysis, Vol. 38, edited by E Predecki , vol.38 , pp. 99-105
- Blanton, T.N.¹ Huang, T.C.² Toraya, H.³ Hubbard, C.R.⁴ Robie, S.B.⁵ Louër, D.⁶ Göbel, H.E.⁷ Will, G.⁸ Gilles, R.⁹ Raftery, T.¹⁰

4
- 0006403631
- (1949) Biochem. J. , vol.44 , pp. 87-91
- Challenger, F.¹ Greenwood, D.²

5
- 0006469987
- (1937) J. Am. Chem. Soc. , vol.59 , pp. 2557-2558
- Fore, D.¹ Bost, R.W.²

6
- 4244115498
- (1992) Chem. Mater. , vol.4 , pp. 353-358
- Francis, C.V.¹ Tiers, G.V.D.²

7
- 0000667012
- (1998) J. Appl. Cryst. , vol.31 , pp. 957-959
- Gilles, R.¹ Keiderling, U.² Wiedenmann, H.³

8
- 0006439008
- (1949) J. Am. Pharm. Assoc. Sci. Ed. , vol.38 , pp. 287-290
- Halpern, A.¹ Glasser, A.C.²

9
- 0000273445
- (1990) J. Appl. Cryst. , vol.23 , pp. 286-291
- Hart, M.¹ Cernik, R.J.² Parrish, W.³ Toraya, H.⁴

10
- 0027576642
- (1993) J. Appl. Cryst. , vol.26 , pp. 180-184
- Huang, T.C.¹ Toraya, H.² Blanton, T.N.³ Wu, Y.⁴

11
- 0006405207
- (1983) J. Appl. Cryst. , vol.16 , pp. 285-288
- Hubbard, C.R.¹

12
- 0001861891
- (1975) J. Appl. Cryst. , vol.8 , pp. 45-48
- Hubbard, C.R.¹ Swanson, H.E.² Mauer, F.A.³

13
- 0000120919
- (1959) J. Phys. Chem. , vol.63 , pp. 248-250
- Ohlberg, S.M.¹

14
- 0000573782
- (1960) Acta Cryst. , vol.13 , pp. 838-850
- Parrish, W.¹

15
- 33947476799
- (1955) J. Am. Chem. Soc. , vol.77 , pp. 2017-2018
- Schaerer, A.A.¹ Busso, C.J.² Smith, A.E.³ Skinner, L.B.⁴

16
- 0000728630
- (1956) Acta Cryst. , vol.9 , pp. 379-384
- Shearer, H.M.M.¹ Vand, V.²

17
- 0343777531
- Washington, DC: National Bureau of Standards (NIST)
- (1966) Standard X-ray Diffraction Powder Patterns, National Bureau of Standards Monograph 29, Sect. 4 , pp. 3-4
- Swanson, H.E.¹ McMurdie, H.F.² Morris, M.C.³ Evans, E.H.⁴

18
- 0025006634
- (1990) Anal. Chim. Acta , vol.237 , pp. 241-244
- Tiers, G.V.D.¹

19
- 0000325685
- (1947) Acta Cryst. , vol.2 , pp. 398-403
- Vand, V.¹ Aitken, A.² Campbell, R.K.³

20
- 84976189177
- (1987) Powder Diffr. , vol.21 , pp. 242-248
- Wong-Ng, W.¹ Hubbard, C.R.²

21
- 0006442511
- (1948) Nature (London) , vol.162 , pp. 23
- Wright, B.A.¹

22
- 0006439009
- (1949) Rev. Sci. Instrum. , vol.20 , pp. 355-356
- Wright, B.A.¹ Cole, P.A.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.