Synchrotron radiation X-ray powder diffractometer with a cylindrical imaging plate

Journal of Applied Crystallography

Volumn 33, Issue 5, 2000, Pages 1241-1245

  Fujiwara, A ^a   Ishii, K ^a   Watanuki, T ^a,d   Suematsu, H ^a   Nakao, H ^a,b   Ohwada, K ^a   Fujii, Y ^a   Murakami, Y ^b   Mori, T ^b   Kawada, H ^b,e   Kikegawa, T ^b   Shimomura, O ^b,d   Matsubara, T ^c   Hanabusa, H ^c   Daicho, S ^c   Kitamura, S ^c   Katayama, C ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b INSTITUTE OF MATERIALS STRUCTURE SCIENCE   (Japan)

^c Mac Science Co Ltd   (Japan)

^d JAPAN ATOMIC ENERGY AGENCY   (Japan)

^e Kawada Research Corporation   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL STRUCTURE; IMAGE ANALYSIS; IMAGE QUALITY; STRUCTURE ANALYSIS; SYNCHROTRON; X RAY POWDER DIFFRACTION;

EID: 0034503452     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800009286     Document Type: Article

References (11)

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