Electro-optic property measurements of electrostatically self-assembled ultrathin films

Optics Communications

Volumn 186, Issue 1-3, 2000, Pages 135-141

  Zhang, Liangmin ^a   Zhang, Fajian ^a   Cooper, Kristie ^b   Wang, Yongqiang ^b   Liu, Yanjing ^b   Claus, Richard ^a,b  

^a State University   (United States)

^b NANOSONIC INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTROOPTICAL MATERIALS; ELECTROSTATICS; ELLIPSOMETRY; ULTRATHIN FILMS;

ELECTROSTATICALLY SELF-ASSEMBLED ULTRATHIN FILMS;

OPTICAL FILMS;

EID: 0034501843     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-4018(00)01064-6     Document Type: Article

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