New validated physically based IGCT model for circuit simulation of snubberless and series operation

Conference Record - IAS Annual Meeting (IEEE Industry Applications Society)

Volumn 5, Issue , 2000, Pages 2866-2872

  Kuhn, H ^a   Schroeder, D ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CARRIER MOBILITY; CATHODES; COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRON SCATTERING; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR SWITCHES;

CIRCUIT SIMULATION; INTEGRATED GATE COMMUTATED THYRISTOR;

THYRISTORS;

EID: 0034501820     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)