Classification of PD patterns from multiple defects

Proceedings of the IEEE International Conference on Properties and Applications of Dielectric Materials

Volumn 1, Issue , 2000, Pages 463-465

  Lee, June Ho ^a   Okamoto, Tatsuki ^a   Yi, Chin Woo ^a  

^a Hoseo University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRODES; NEURAL NETWORKS; PATTERN RECOGNITION;

BACK PROPAGATION ALGORITHMS; NEEDLE PLANE ELECTRODE SYSTEM; STATISTICAL OPERATORS;

PARTIAL DISCHARGES;

EID: 0034501546     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)