|
|
|
Volumn 1, Issue , 2000, Pages 662-665
|
|
Measuring the shielding performance of materials
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
ELECTRIC DISCHARGES;
ELECTRIC FIELDS;
ELECTROSTATICS;
MICROELECTRONICS;
NETWORKS (CIRCUITS);
SEMICONDUCTOR DEVICES;
TRANSIENTS;
ELECTRIC SHIELDING MEASUREMENT;
ELECTROSTATIC SPARK DISCHARGES;
MATCHING SHIELDING;
ELECTRIC SHIELDING;
|
|
EID: 0034501514
PISSN: 01972618
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
|
Times cited : (3)
|
|
References (10)
|
