|
Volumn 35, Issue 23, 2000, Pages 5989-5994
|
Microstructure of XDTM Ti-6Al/TiC composites
|
Author keywords
[No Author keywords available]
|
Indexed keywords
CRYSTAL MICROSTRUCTURE;
CRYSTALLOGRAPHY;
GRAIN BOUNDARIES;
HIGH RESOLUTION ELECTRON MICROSCOPY;
INTERFACES (MATERIALS);
LATTICE CONSTANTS;
MORPHOLOGY;
NUMERICAL ANALYSIS;
SCANNING ELECTRON MICROSCOPY;
TITANIUM CARBIDE;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
DENDRITICAL MORPHOLOGY;
ENERGY SPECTRUM DIFFRACTION;
SPHERICAL MORPHOLOGY;
TITANIUM ALUMINUM ALLOYS;
METALLIC MATRIX COMPOSITES;
|
EID: 0034500272
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1026794810924 Document Type: Article |
Times cited : (19)
|
References (8)
|