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Volumn 470, Issue 1-2, 2000, Pages
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Variation of threshold field in field induced fabrication of Au nanodots on ultrathin in situ grown silicon oxide
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Author keywords
[No Author keywords available]
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Indexed keywords
EVAPORATION;
FEEDBACK CONTROL;
SCANNING TUNNELING MICROSCOPY;
SILICA;
SURFACE ROUGHNESS;
ULTRATHIN FILMS;
NANODOTS;
ULTRATHIN OXIDE LAYERS;
GOLD;
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EID: 0034499604
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(00)00897-9 Document Type: Article |
Times cited : (8)
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References (19)
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