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Volumn 470, Issue 1-2, 2000, Pages

Variation of threshold field in field induced fabrication of Au nanodots on ultrathin in situ grown silicon oxide

Author keywords

[No Author keywords available]

Indexed keywords

EVAPORATION; FEEDBACK CONTROL; SCANNING TUNNELING MICROSCOPY; SILICA; SURFACE ROUGHNESS; ULTRATHIN FILMS;

EID: 0034499604     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00897-9     Document Type: Article
Times cited : (8)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.