Single event effects and total ionizing dose results of a low voltage EEPROM

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2000, Pages 64-67

  Krawzsenek, D ^a   Hsu, P ^a   Anthony, H ^a   Land, C ^a  

^a MAXWELL TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DOSIMETRY; ELECTRIC POWER SUPPLIES TO APPARATUS; ELECTRONICS INDUSTRY; IONIZING RADIATION; PROM; RADIATION EFFECTS; SEMICONDUCTOR DEVICE TESTING; SPACE APPLICATIONS;

DEVICE UNDER TEST; LINEAR ENERGY TRANSFER; SEMICONDUCTOR INDUSTRY; SINGLE EVENT EFFECTS; SPACE INDUSTRY; TOTAL IONIZING DOSE;

RADIOACTIVITY MEASUREMENT;

EID: 0034499549     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (0)