Application of cluster ion beam smoothing to SiC and YBCO surfaces

Materials Research Society Symposium - Proceedings

Volumn 585, Issue , 2000, Pages 313-318

  Fathy, D ^a   Holland, O W ^a,b   Liu, R ^a   Wosik, J ^a   Chu, W K ^a  

^a UNIVERSITY OF HOUSTON   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; HIGH TEMPERATURE SUPERCONDUCTORS; OPTIMIZATION; SILICON CARBIDE; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM COMPOUNDS;

GAS CLUSTER ION BEAMS (GCIB); SURFACE SMOOTHING;

ION BEAMS;

EID: 0034499423     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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7. To be published.