Comparison between photo-, cathodo-, and electro-luminescence spectra of polyethylene naphthalate films and relationship with electrical aging

Conference on Electrical Insulation and Dielectric Phenomena (CEIDP), Annual Report

Volumn 2, Issue , 2000, Pages 543-546

  Teyssedre, G ^a   Laurent, C ^a   Jonnard, P ^b   Bonnelle, C ^b  

^a UNIVERSITÉ PAUL SABATIER   (France)

^b SORBONNE UNIVERSITÉ   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE; DEGRADATION; ELECTRIC CHARGE; ELECTROLUMINESCENCE; INSULATING MATERIALS; PLASTIC FILMS;

DEGRADATION MECHANISMS; ELECTRICAL AGING; POLYETHYLENE NAPHTHALATE FILMS;

POLYETHYLENES;

EID: 0034499122     PISSN: 00849162     EISSN: None     Source Type: Journal    
DOI: 10.1109/CEIDP.2000.884018     Document Type: Article

References (7)

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2. P. S. R. Cheung C. W. Roberts K. B. Wagener Synthesis, photodegradation, and energy transfer in a series of poly(ethylene terephthalate-co-2,6-naphthalenedicarboxylate) copolymers J. Appl. Polym. Sci. 24 1809 1830 1979
3. F. Massines P. Tiemblo G. Teyssèdre C. Laurent On the nature of the luminescence emitted by a polypropylene film after interaction with a cold plasma at low temperature J. Appl. Phys. 81 937 943 1997
4. D. Mary M. Albertini C. Laurent Understanding optical emissions from electrically stressed insulating polymers: electroluminescence in PET and PEN films J. Phys. D 30 171 184 1997
5. C. Bonnelle F. Vergand P. Jonnard J.-M. André P. Avila P. Chargelègue M.-F. Fontaine D. Laporte P. Paquier A. Ringuenet B. Rodriguez Instrument for Research on Interfaces and Surfaces (IRIS) Rev. Sci. Instrum. 65 3466 3471 1994
6. P. Jonnard P. Chargelègue C. Hombourger J. Thirion F. Vergand Temperature-dependent sample holder for x-ray spectrometer Rev. Sci. Instrum. 67 2417 2418 1996
7. G. Teyssedre D. Mary J. L. Augé C. Laurent Dependence of electroluminescence intensity and spectral distribution on ageing time in polyethylene naphthalate as modelled by space charge-modified internal field J. Phys. D 32 2296 2305 1999