Pattern matching based on a generalized Fourier transform

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4116, Issue , 2000, Pages 472-480

  Nair, Dinesh ^a   Rajagopal, Ram ^a   Wenzel, Lothar ^a  

^a NATIONAL INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER VISION; FOURIER TRANSFORMS;

WALSH TRANSFORMS;

PATTERN MATCHING;

EID: 0034499092     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.406527     Document Type: Conference Paper

References (4)