Microfocusing with grazing incidence X-ray micromirrors

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4144, Issue 1, 2000, Pages 165-173

  Pina, Ladislav ^a   Inneman, Adolf ^a   Hudec, René ^b   Arndt, Uli W ^c   Loxley, Neil ^d   Fraser, Graham ^d   Taylor, Mark ^d   Wall, John ^d  

^a Reflex sro   (Czech Republic)

^b ASTRONOMICAL INSTITUTE   (Czech Republic)

^c MRC LABORATORY OF MOLECULAR BIOLOGY   (United Kingdom)

^d Bede Scientific Instruments Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; DATA REDUCTION; FOCUSING; MICROOPTICS; OPTICAL DESIGN; RAY TRACING; X RAYS;

GRAZING INCIDENCE MICROMIRRORS; MICROFOCUSING;

MIRRORS;

EID: 0034498801     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.405890     Document Type: Article

References (0)