Transmission electron microscopy, electron diffraction and hardness studies of high-pressure and high-temperature treated C60

Journal of Physics Condensed Matter

Volumn 12, Issue 50, 2000, Pages 10411-10421

  Wood, R A ^a   Lewis, M H ^a   West, G ^a   Bennington, S M ^b   Cain, M G ^c   Kitamura, N ^d  

^a UNIVERSITY OF WARWICK   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c NATIONAL PHYSICAL LABORATORY   (United Kingdom)

^d OSAKA NATIONAL RESEARCH INSTITUTE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; GRAPHITE; GRAPHITIZATION; POLYMERS; TRANSMISSION ELECTRON MICROSCOPY;

ELASTIC RECOVERY;

FULLERENES;

EID: 0034498732     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/12/50/304     Document Type: Article

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