Polarimetric characterization of Federal Standard paints

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4133, Issue , 2000, Pages 112-123

  Goldstein, Dennis H ^a  

^a AIR FORCE RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; MATRIX ALGEBRA; PAINT; POLARIMETERS; SUBSTRATES;

MUELLER MATRICES; SPECTROPOLARIMETERS;

LIGHT POLARIZATION;

EID: 0034498708     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.406618     Document Type: Conference Paper

References (7)