Single event upset characterization of the Pentium MMX and Celeron microprocessors using proton irradiation

IEEE Radiation Effects Data Workshop

Volumn , Issue , 2000, Pages 39-44

  Hiemstra, David M ^a   Baril, Allan ^a  

^a Macdonald Dettwiler   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN SELF TEST; CMOS INTEGRATED CIRCUITS; ELECTRONICS PACKAGING; GATES (TRANSISTOR); INTEGRATED CIRCUIT TESTING; MICROPROCESSOR CHIPS; PROTON IRRADIATION;

CERAMIC PIN GRID ARRAY; PLASTIC PIN GRID ARRAY; SINGLE EVENT EFFECTS; SINGLE EVENT LATCHUP; SINGLE EVENT UPSET CHARACTERIZATION;

RADIATION EFFECTS;

EID: 0034498604     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (17)