Analytical model for punch-through limited breakdown voltage of planar junction with multiple floating field limiting rings

Solid-State Electronics

Volumn 44, Issue 12, 2000, Pages 2109-2116

  Bae, Dong Gun ^a   Chung, Sang Koo ^a  

^a Ajou University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN OF SOLIDS; OPTIMIZATION; SEMICONDUCTOR DEVICE MODELS;

MULTIPLE FIELD RING MODELING; PUNCH-THROUGH LIMITED BREAKDOWN VOLTAGES; SOFTWARE PACKAGE MEDICI;

SEMICONDUCTOR JUNCTIONS;

EID: 0034497970     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(00)00162-3     Document Type: Article

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