Scanning tunneling microscopy images of the atoms in the corner holes on the Si(111)-(7×7) surface with bismuth-covered tips

Surface Science

Volumn 469, Issue 2-3, 2000, Pages 127-132

  Bulavenko, S Yu ^a   Melnik, P V ^a   Nakhodkin, M G ^a  

^a TARAS SHEVCHENKO NATIONAL UNIVERSITY OF KYIV   (Ukraine)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; BISMUTH; CRYSTAL ORIENTATION; DEPOSITION; SCANNING TUNNELING MICROSCOPY; TUNGSTEN;

CORNER HOLES;

SEMICONDUCTING SILICON;

EID: 0034497852     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(00)00798-6     Document Type: Article

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