Accurate electrical measurement of coupled lines on lossy silicon

IEEE Topical Meeting on Electrical Performance of Electronic Packaging

Volumn , Issue , 2000, Pages 181-184

  Arz, Uwe ^a   Williams, Dylan F ^a   Walker, David K ^a   Grabinski, Hartmut ^a  

^a LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE MATERIALS; ELECTRIC IMPEDANCE; SILICON;

ASYMMETRIC COUPLED LINES;

ELECTRIC LINES;

EID: 0034497089     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (10)