Study of structure and mixing at the interface between Fe and AlGaAs (100)

Thin Solid Films

Volumn 379, Issue 1-2, 2000, Pages 114-121

  Monteverde, F ^a   Michel, A ^a   Kherici, A ^a   Eymery, J P ^a  

^a UNIVERSITÉ DE POITIERS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; GRAIN SIZE AND SHAPE; INTERFACES (MATERIALS); IRON; MIXING; MOLECULAR BEAM EPITAXY; MOSSBAUER SPECTROSCOPY; POLYCRYSTALLINE MATERIALS; SEMICONDUCTING ALUMINUM COMPOUNDS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY; X RAY CRYSTALLOGRAPHY;

ION BEAM SPUTTERING METHOD;

SEMICONDUCTING FILMS;

EID: 0034496997     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)01354-7     Document Type: Article

References (32)

1. Prinz G.A. Science. 250:1990;1092.
2. Prinz G.A. Heinrich B., Bland J.A.C. Ultrathin Magnetic Structures II. 1994;1 Springer-Verlag, Berlin.
3. Prinz G.A., Krebs J.J. Appl. Phys. Lett. 39:1981;397.
4. Qadri S.B., Goldenberg M., Prinz G.A., Ferrari J.M. J. Vac. Sci. Technol. B. 3:1985;718.
5. Prinz G.A., Jonker B.T., Krebs J.J., Ferrari J.M., Kovanic F. Appl. Phys. Lett. 48:1986;1756.
6. Krebs J.J., Jonker B.T., Prinz G.A. J. Appl. Phys. 61:1987;2596.
7. Tustison R.W., Varitimos T., Van Hook J., Schloemann E.F. Appl. Phys. Lett. 51:1987;285.
8. Bernstein S.D., Wong T.Y., Tustison R.W. J. Vac. Sci. Technol. B. 12:1994;605.
9. Li B., Fermin J.R., Azevedo A., de Aguiar F.M., Rezende S.M. Appl. Phys. Lett. 72:1998;2760.
10. Kreuzer S., Prügl K., Bayreuther G., Weiss D. Thin Solid Films. 318:1998;219.
11. Harp G.R., Parkin S.S.P. Thin Solid Films. 288:1996;315.
12. Bernstein S.D., Wong T.Y., Tustison R.W. J. Appl. Phys. 72:1992;4358.
13. Rahmoune M., Eymery J.P. J. Phys. III France. 4:1994;859.
14. Rahmoune M., Eymery J.P., Goudeau Ph., Denanot M.F. Thin Solid Films. 289:1996;261.
15. Rahmoune M., Eymery J.P., Denanot M.F. J. Magn. Magn. Mat. 175:1997;219.
16. Hung C.Y., Harris J.S., Marshall A.F., Kiehl R.A. Appl. Phys. Lett. 73:1998;330.
17. Hirayama Y., Saku T. J. Vac. Sci. Technol. B. 16:1998;2543.
18. Filipe A., Schuhl A. J. Appl. Phys. 81:1997;4359.
19. Filipe A., Schuhl A., Galtier P. Appl. Phys. Lett. 70:1997;129.
20. A. Filipe, Thesis, Ecole Polytechnique, Palaiseau, France, 1997.
21. Députier S., Guérin R., Lépine B., Guivarc'h A., Jézéquel G. J. Alloys Compounds. 262:1997;416.
22. Lépine B., Ababou S., Guivarc'h A., Jézéquel G., Députier S., Guérin R., Filipe A., Schuhl A., Abel F., Cohen C., Rocher A., Crestou J. J. Appl. Phys. 83:1998;3077.
23. Bodin D., Eymery J.P. Nucl. Instr. Meth. B. 16:1986;424.
24. Liljequist D., Ekdahl T., Baverstam U. Nucl. Instr. Meth. 155:1978;529.
25. Windischmann H. Crit. Rev. Solid State Mater. Sci. 17:1992;547.
26. Datta S., Das B. Appl. Phys. Lett. 56:1990;665.
27. Rancourt D.G., Daniels J.M., Lam H.Y. Can. J. Phys. 63:1985;1540.
28. Raj P., Kulshreshtha S.K. Phys. Scr. 14:1976;125.
29. Grandjean F., Gerard A., Sobry R. Int. J. Magn. 4:1972;1.
30. Kim K.B., Kniffin M., Sinclair R., Helms C.R. J. Vac. Sci. Technol. A. 6:1988;1473.
31. Sands T., Keramidas V.G., Yu A.J., Yu K.M., Gronsky R., Washburn J. J. Mater. Res. 2:1987;262.
32. Häggström L., Granäs L., Wäppling R., Devanarayanan S. Phys. Scr. 7:1973;125.