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Volumn 22, Issue 3, 2000, Pages 167-172

Direct measurement of electron beam scattering in the environmental scanning electron microscope using phosphor imaging plates

Author keywords

Electron scattering; Environmental scanning electron microscope; Phosphor imaging plates; Photostimulable luminescence; Skirt

Indexed keywords

PHOSPHORUS;

EID: 0034493678     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950220304     Document Type: Article
Times cited : (15)

References (13)
  • 4
    • 0031784162 scopus 로고    scopus 로고
    • Quantitative secondary ion mass spectrometry of self-assembled monolayer films for electron beam dose mapping in the environmental scanning electron microscope
    • (1998) Scanning , vol.20 , pp. 404-409
    • Gillen, G.1    Wight, S.2    Bright, D.3    Herne, T.4
  • 6
    • 0001854223 scopus 로고    scopus 로고
    • Modeling the electron-gas interaction in low-vacuum SEMs
    • (Eds. Bailey, Corbett, Dimlich, Micheal, Zaluzec) San Francisco Press
    • (1996) Microsc Microanal , pp. 836-837
    • Joy, D.C.1
  • 11
    • 22444453888 scopus 로고    scopus 로고
    • Beam size in the environmental SEM: A comparison of model and experimental data
    • (1998) Microsc Microanal , vol.4 , Issue.SUPPL. 2 , pp. 298-299
    • Wight, S.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.