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Volumn 22, Issue 3, 2000, Pages 167-172
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Direct measurement of electron beam scattering in the environmental scanning electron microscope using phosphor imaging plates
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Author keywords
Electron scattering; Environmental scanning electron microscope; Phosphor imaging plates; Photostimulable luminescence; Skirt
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Indexed keywords
PHOSPHORUS;
ACCURACY;
ARTICLE;
ELECTRON BEAM;
ELECTRON DIFFRACTION;
LUMINESCENCE;
MEASUREMENT;
PHOTOSTIMULATION;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
ELECTRON BEAMS;
ELECTRON SCATTERING;
LUMINESCENCE;
PHOSPHORS;
PHOTOSTIMULABLE LUMINESCENCE;
SCANNING ELECTRON MICROSCOPY;
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EID: 0034493678
PISSN: 01610457
EISSN: None
Source Type: Journal
DOI: 10.1002/sca.4950220304 Document Type: Article |
Times cited : (15)
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References (13)
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