Determination of specific surfaces of silica xerogels by SAXS

Chinese Science Bulletin

Volumn 45, Issue 15, 2000, Pages 1386-1390

  Li, Zhihong ^a   Sun, Jihong ^a   Wu, Dong ^a   Sun, Yuhan ^a   Liu, Yi ^b   Sheng, Wenjun ^b   Dong, Baozhong ^b  

^a INSTITUTE OF COAL CHEMISTRY   (China)

^b INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

Silica xerogel; Small angle X ray scattering; Specific surface

Indexed keywords

SILICON DIOXIDE;

ARTICLE; CHEMICAL STRUCTURE; GEL; RADIATION SCATTERING; SURFACE PROPERTY; SYNCHROTRON; THEORY;

EID: 0034484729     PISSN: 10016538     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02886243     Document Type: Article

References (10)

1. Application of SAXS in structural study of porous material (II) - Application of SAXS
2. X-ray diffraction of monocrystal
3. Surface areas of fillers in polymers by small-angle X-ray scattering
4. The measuring method and the data processing of SAXS
5. Modification of the structure of an active carbon by heat treatment
6. SAXS investigations on the porosity of pitch based carbon fibres
7. The determination of diffuse-boundary thickness of polymers by small angle X-ray scattering
8. SAXS study on the microstructure of the matrices of carbon fibres
9. The determination of the internal specific surface of two-phase system by small angle X-ray scattering