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Volumn , Issue , 2000, Pages 676-680
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One micron precision, wafer-level aligned bonding for interconnect, MEMS and packaging applications
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Author keywords
[No Author keywords available]
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Indexed keywords
BONDING;
COPPER;
ELECTRONICS PACKAGING;
INFRARED RADIATION;
INTEGRATED CIRCUIT MANUFACTURE;
MICROELECTROMECHANICAL DEVICES;
CHIP SCALE;
MICRON ALIGNMENT;
PRECISION ALIGNMENT POSITIONING SYSTEMS;
SUBSTRATE TO SUBSTRATE ALIGNMENT TECHNIQUES;
WAFER LEVEL ALIGNED BONDING;
SILICON WAFERS;
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EID: 0034484432
PISSN: 05695503
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (40)
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References (7)
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