Bridging the gap between embedded test and ATE

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 55-63

  Bell, Martin ^a   Danialy, Givargis ^a   Howells, Michael ^a   Pateras, Stephen ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING; BUILT-IN SELF TEST; COMPUTER OPERATING SYSTEMS; FAILURE ANALYSIS; SOFTWARE ENGINEERING;

DEVICE UNDER TEST; EMBEDDED TEST ACCESS SOFTWARE; EMBEDDED TEST BLOCKS; EMBEDDED TEST STRUCTURES; SOFTWARE SYSTEM ARCHITECTURE; TEST EQUIPMENT;

EMBEDDED SYSTEMS;

EID: 0034484415     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)