Test and on-line debug capabilities of IEEE Std 1149.1 in ultraSPARC-III microprocessor

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 141-150

  Golshan, Farideh ^a  

^a SUN MICROSYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER ARCHITECTURE; COMPUTER DEBUGGING; DATA STORAGE EQUIPMENT; INTERFACES (COMPUTER); MICROPROCESSOR CHIPS;

BOUNDARY SCAN; ONLINE DEBUG;

INTEGRATED CIRCUIT TESTING;

EID: 0034484254     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)