Efficient test mode selection & insertion for RTL-BIST

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 263-272

  Roy, Subrata ^a   Guner, Gokhan ^a   Cheng, Kwang Ting ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; FAILURE ANALYSIS; LOGIC DESIGN; SHIFT REGISTERS;

OPERATOR TEST POINT; REGISTER TRANSFER LEVEL; TEST MODE SELECTION;

BUILT-IN SELF TEST;

EID: 0034482879     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)