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Volumn 23, Issue 4, 2000, Pages 673-683
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Residual thermomechanical stresses in thinned-chip assemblies
a a b b c c d d |
Author keywords
3 D integration; BCB; Copper; Creep; Finite element simulation; Interconnects; MCM; Process modeling; Thermomechanical stresses
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Indexed keywords
COMPUTER SIMULATION;
COPPER;
CREEP;
DELAMINATION;
DIELECTRIC MATERIALS;
FINITE ELEMENT METHOD;
INTEGRATED CIRCUIT LAYOUT;
INTERCONNECTION NETWORKS;
MULTICHIP MODULES;
RESIDUAL STRESSES;
SEMICONDUCTING SILICON;
BENZOCYCLOBUTENE;
PROCESS MODELING;
THERMOMECHANICAL STRESSES;
THINNED CHIP ASSEMBLIES;
THREE DIMENSIONAL INTEGRATION;
ULTRATHIN CHIP STACKING;
INTEGRATED CIRCUIT MANUFACTURE;
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EID: 0034482866
PISSN: 15213331
EISSN: None
Source Type: Journal
DOI: 10.1109/6144.888852 Document Type: Article |
Times cited : (6)
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References (14)
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