Diagnostic test generation for sequential circuits

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 225-234

  Yu, Xiaoming ^a   Wu, Jue ^a   Rudnick, Elizabeth M ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMBINATORIAL CIRCUITS; COMPUTER SIMULATION; DESIGN FOR TESTABILITY; GENETIC ALGORITHMS; LEAKAGE CURRENTS; RESPONSE TIME (COMPUTER SYSTEMS); SEMICONDUCTOR DEVICE TESTING; SEQUENTIAL CIRCUITS;

DETECTION ORIENTED TEST SET; DIAGNOSTIC FAULT SIMULATOR; DIAGNOSTIC TEST GENERATION;

VLSI CIRCUITS;

EID: 0034482661     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (25)