Single chip test and burn-in

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2000, Pages 810-814

  Forster, James ^a   Gilg, Larry ^b  

^a TEXAS INSTRUMENTS   (United States)

^b Microelectronics Computer Technology Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BURN-IN STRESS SCREENING; SINGLE CHIP TEST;

COST BENEFIT ANALYSIS; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUIT TESTING; MARKETING; RELIABILITY; VLSI CIRCUITS;

ELECTRONICS PACKAGING;

EID: 0034482528     PISSN: 05695503     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)