Using a prism to reject or select harmonic reflections in an X-ray monochromator

Journal of Applied Crystallography

Volumn 33, Issue 4, 2000, Pages 1082-1087

  Zhong, Z ^a  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CRYSTAL; IMAGING SYSTEM; PRISM; REFLECTOMETRY; REFRACTION INDEX; SPECTRAL SENSITIVITY; SURFACE PROPERTY; THEORY; X RAY;

EID: 0034481526     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800005343     Document Type: Article

References (11)

1. Berman, L. E., Durbin, S. M. & Batterman, B. W. (1985). Nucl. Instrum. Methods Phys. Res. A, 241, 295-301.
2. Bonse, U., Materlik, G. & Schröder, W. (1976). J. Appl. Cryst. 9,223-230.
3. Bonse, U., Olthoff-Münter, K. & Rumpf, A. (1983). J. Appl. Cryst. 16, 524-531.
4. Caciuffo, R., Melone, S., Rustichelli, F. & Boeuf, A. (1987). Phys. Rep. 152, 1-71.
5. Chapman, D., Thomlinson, W., Johnston, R. E., Washburn, D., Pisano, E., Gmür, R., Zhong, Z., Menk, R., Arfelli, F. & Sayers, D. (1997). Phys. Med. Biol. 42, 2015-2025.
6. Davies, B. & Slack, M. (1926). Phys. Rev. 27, 18-22.
7. Deutsch, M. & Hart, M. (1984). Phys. Rev. B, 30, 643-646.
8. Fontaine, A. & Warburton, W. K. (1985). Phys. Rev. B, 31, 3599-3605.
9. Guinier, A. (1963). X-ray Diffraction in Crystals, Imperfect Crystals and Amorphous Bodies, §1.1. San Francisco: W. H. Freeman.
10. Zachariasen, W. H. (1945). Theory of X-ray Diffraction in Crystals. New York: John Wiley.
11. Zhong, Z., Thomlinson, W., Chapman, D. & Sayers, D. (2000). Nucl. lustrum. Methods Phys. Res. A. In the press.