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Volumn 33, Issue 2, 2000, Pages 330-333

Extinction-corrected mean thickness and integral width used in the program UMWEG98

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; COMPUTER GRAPHICS; COMPUTER PROGRAM; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; MATHEMATICAL COMPUTING; STRUCTURE ANALYSIS; THICKNESS;

EID: 0034480840     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800000698     Document Type: Article
Times cited : (10)

References (14)
  • 5
    • 4243440214 scopus 로고
    • Frankfurt Am Main: Akademische Verlagsgesellschaft
    • Laue, M. von (1960). Röntgenstrahlinterferenzen. Frankfurt Am Main: Akademische Verlagsgesellschaft.
    • (1960) Röntgenstrahlinterferenzen
    • Von Laue, M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.