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Volumn 41, Issue 2, 2000, Pages 104-106

Crack speed in ultraporous brittle amorphous material

Author keywords

[No Author keywords available]

Indexed keywords

GLASS; SILICON DIOXIDE;

EID: 0034480646     PISSN: 00319090     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (9)

References (22)
  • 3
    • 0003076938 scopus 로고
    • Stress waver fractography
    • Fractography of glass. Edited by R.C. Bradt & R.E. Tressler. Plenum Press, New York
    • (1994) , pp. 75-109
    • Richter, H.G.1    Kerkhof, F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.