IEEE 1232 and P1522 standards

AUTOTESTCON (Proceedings)

Volumn , Issue , 2000, Pages 388-397

  Sheppard, John ^a   Kaufman, Mark ^a  

^a ARINC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; COMPUTER AIDED MANUFACTURING; COMPUTER SOFTWARE; COMPUTER SOFTWARE MAINTENANCE; COMPUTER TESTING;

SOFTWARE SERVICES; TESTABILITY AND DIAGNOSABILITY METRICS;

STANDARDS;

EID: 0034480555     PISSN: 07347510     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (16)