Test response compaction by an accumulator behaving as a multiple input non-linear feedback shift register

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 804-811

  Bakalis, D ^a   Nikolos, D ^a   Kavousianos, X ^a  

^a UNIVERSITY OF PATRAS   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

ADDERS; COMPUTER HARDWARE; FLIP FLOP CIRCUITS; MULTIPLYING CIRCUITS; SHIFT REGISTERS;

MULTIPLE INPUT NONLINEAR FEEDBACK SHIFT REGISTER; POST COMPACTION FAULT; TEST RESPONSE COMPACTION;

BUILT-IN SELF TEST;

EID: 0034480139     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)