Technique for the characterization of multi-terminal capacitors for high frequency applications

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2000, Pages 445-448

  Figueroa, David G ^a   Li, Y L ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC PROPERTIES; EQUIVALENT CIRCUITS; MICROPROCESSOR CHIPS; SURFACE MOUNT TECHNOLOGY;

HIGH FREQUENCY APPLICATIONS; MICROPROCESSOR TECHNOLOGIES; MULTI TERMINAL CAPACITORS;

CAPACITORS;

EID: 0034479276     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (12)