DFT advances in Motorola's next-generation 74xx PowerPC microprocessor

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 131-140

  Raina, Rajesh ^a   Bailey, Robert ^a   Belete, Dawit ^a   Khosa, Vikram ^a   Molyneaux, Robert ^a   Prado, Javier ^a   Razdan, Ashutosh ^a  

^a MOTOROLA INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER STORAGE; BUILT-IN SELF TEST; CMOS INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; TRANSISTORS;

FULL SCAN DESIGN; LEVEL SENSITIVE SCAN DESIGN;

DESIGN FOR TESTABILITY;

EID: 0034479268     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)