Influence of the layer morphology on the electrical properties of sol gel transparent conducting oxide coatings

Journal of Sol-Gel Science and Technology

Volumn 19, Issue 1-3, 2000, Pages 435-439

  Goebbert, Christian ^a   Gasparro, Guido ^a   Schuler, Thomas ^a   Krajewski, Thomas ^a   Aegerter, Michel A ^a  

^a INM LEIBNIZ INSTITUTE FOR NEW MATERIALS   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; COMPOSITION EFFECTS; ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC PROPERTIES; MORPHOLOGY; MULTILAYERS; NUCLEATION; TEXTURES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

HALL MEASUREMENT; TRANSPARENT CONDUCTING COATINGS; VAN DER PAUW MEASUREMENT;

SOL-GELS;

EID: 0034478770     PISSN: 09280707     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1008747429862     Document Type: Article

References (4)

1. H.L. Hartnagel, A.L. Dawar, A.K. Jain, and G. Jagadish, Semiconducting Transparent Thin Films (Institute of Physics, Bristol and Philadelphia, 1995).
2. M.A. Aegerter, A. Reich, G. Ganz, G. Gasparro, and J. Pütz, J. Non Cryst. Solids 218, 123 (1997).
3. J. Pütz, D. Ganz, G. Gasparro, and M.A. Aegerter, in Proc. Int. Conference Sol-Gel 97, Sheffield, UK, 31.08-05.09 1997.
4. C. Goebbert, M.A. Aergerter, D. Burgard, R. Nass, and H. Schmidt, J. Mater. Chem. 9, 253 (1999).