Optimal analog trim techniques for improving the linearity of pipeline ADCs

IEEE International Test Conference (TC)

Volumn , Issue , 2000, Pages 367-375

  Kuyel, Turker ^a   Tsay, Frank ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITOR MISMATCH; CAPACITOR TRIMMING; PIPELINE ANALOG TO DIGITAL CONVERTERS;

AMPLIFIERS (ELECTRONIC); CAPACITORS; CMOS INTEGRATED CIRCUITS; COST EFFECTIVENESS; DIGITAL TO ANALOG CONVERSION; INTEGRATED CIRCUIT TESTING; PERFORMANCE; PROM;

ANALOG TO DIGITAL CONVERSION;

EID: 0034478724     PISSN: 10893539     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)