Structural and loss characterization of sion layers for optical waveguide applications

Conference Proceedings - Lasers and Electro-Optics Society Annual Meeting-LEOS

Volumn 2, Issue , 2000, Pages 760-761

  Ay, Feridun ^a   Aydinli, Atilla ^a   Roeloffzen, Chris ^b   Driessen, Alfred ^b  

^a BILKENT UNIVERSITY   (Turkey)

^b UNIVERSITY OF TWENTE   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; FOURIER TRANSFORM INFRARED SPECTROSCOPY; HYDROGEN BONDS; LIGHT ABSORPTION; OPTICAL FILMS; OPTICAL VARIABLES MEASUREMENT; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; REFRACTIVE INDEX; SILICON COMPOUNDS;

BENDING VIBRATIONS; OPTICAL LOSS MEASUREMENT; SILICON OXYNITRIDE FILM; STRETCHING VIBRATIONS;

OPTICAL WAVEGUIDES;

EID: 0034478609     PISSN: 10928081     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (0)